Metrology Laboratory No. II

Summary:

In this laboratory, a variety of optical methods have been developed for measurement of: 3D shape, temperature, and force, using fringe projection and interferometry techniques. In particular interferometry techniques, are well known for achieving high precision in physical measurements, with measurements that range from the micrometric up to the nanometric scales.

Technologies:

Moiré interferometry, speckle interferometry, digital holography, structured light projection, digital processing of fringe patterns.

Equipment:

Vibration insensitive tables, lasers, cameras, software and hardware for deformation analysis resulting from force loads. Photoresist deposition and development facilities.

For more information please contact:

Dr. Juan Antonio Rayas Alvarez
Phone: 477 4414200 ext. 127-346-329
Building: E (Octágono)
Door: 305